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Fraunhofer IISB and Park Systems are announcing the call for abstracts as well as opening registration for the 2nd International Symposium on Failure Analysis and Material Testing - FAMT 2022.

 
This symposium gathers the professionals from the electronic industry to discuss innovative testing methods at nanoscale and tools for physical failure analysis of the future.
 
The event is going to be held in a hybrid form:
 
ON-SITE VENUE: Fraunhofer IISB, Schottkystrasse 10, Erlangen, Germany
VIRTUAL PLATFORM: Zoom
 
The design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet the international quality standards. Detection and classification of nanometer-sized material defects require characterization methods with a resolution in the nanometer range.
 
Are you experiencing similar challenges in your daily work? Join us on July 22, 2022!
 
 

Join us as an expert and present your application study

Submit your ABSTRACT here:

7 kd

 Deadline: June 15, 2022
Join as listener and network with the semi-commnunity

 FAMT FLYER 2 0

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SESSIONS

○ Emerging applications in the electronic industry

○ case studies from the semiconductor device applications

○ Innovative methods and tools for characterization of the material and defect review

○ Future methods for increasing line productivity, efficiency, and yield

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Access to the event is free of charge.

 

Contact:

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