April 10-11, 2017
Houston, Texas

Park Systems will be exhibiting at the Advanced Coatings and Characterization Methods Conference in Houston, TX April 10 and 11, 2017. Be sure to attend the presentation on advanced analytical methods with Atomic Force Microscopy featuring speaker Keibock Lee, President Park Systems on April 11 at 3pm.

Join Park Systems and fifteen other highly selected companies featuring Innovative Instrumentation and Products used in the Coatings industry on the exhibit floor from April 10-11. Learn from industry experts in coatings, material and characterization about the latest research and industry trends in Polymer Coatings and Nanostructured Materials, Corrosion and Characterization and Analytical Methods.

 Join us as we introduce you to the latest advances in AFM metrology featuring a talk titled "In-line (3D) AFM as Solution Provider for Beyond N10 Process" from imec Senior Researcher, Dr. Tae-Gon Kim!

Visit our office in Santa Clara on Friday, March 23, 2017 from 5pm - 7pm as we serve some craft brew, bites to eat, and some friendly chatter as we all catch up on our work at the nanoscale and atomic force microscopy (AFM)!

Park Systems visits downtown San Jose to hold a luncheon alongside the 2017 SPIE Advanced Lithography conference. After the world's premier lithography event kicks off its programming on Monday, February 27, join us just a block away from the San Jose Convention Center at Morton's The Steakhouse for lunch and to learn about the latest advances in nanoscale characterization for the semiconductor industry

In proud partnership with the University of Delaware, Park Systems is proud to announce a free workshop and live demo to take place on October 11, 2016 at Brown Laboratory on campus. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM System—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.

In proud partnership with the New Jersey Institute of Technology, Park Systems is proud to announce a free workshop and live demo to take place on October 6, 2016 at Tiernan Hall and the Otto H. York Center for Environmental Engineering and Science. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM System—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.