AFM experts provide you ONLINE courses, easy and comfortable to join from home! FREE access for you to all content: Webinars, Live Demos, Educational Videos, Software Operation, NanoScientific Talk! Microscopy research has never been so easy before!
Upcoming Webinar
Application of Atomic Force Microscopy in perovskite solar cells (Chinese/中文)
Wednesday, April 29, 2020 / 10:00am CST
As one of the most powerful scanning probe microscopy (SPM) techniques, atomic force microscopy (AFM) can not only detect...
Investigation of Lithium Ion Battery Electrodes Using Pinpoint SSRM in Vacuum
Wednesday, April 29, 2020 / 9:00 am PDT
The applications staff of Park Systems is proud to present an introduction to PinPoint scanning spreading resistance microscopy (SSRM).
Advanced Piezoresponse Force Microscopy
Wednesday, April 29, 2020 / 11:00 am CST
The application the ferroelectric materials in communication and information technology or data storage continuously increases.
Live Demo
From automatization in research to quality control for industrial applications
Wednesday, April 22, 2020/ 9:30 am GMT
Learn how automation features in AFM can easily be implemented into your workflow to boost the productivity in your lab.
SmartScan Advanced KPFM Imaging
Friday, April 24, 2020 / 12:00 pm PDT
Measuring the electrostatic interaction between the atomic force microscope (AFM) tip and sample is a common technique used to characterize electrically sensitive samples.
Full-automation AFM in-line capabilities
Wednesday, May 6, 2020 / 3:00 pm GMT
In this LIVE DEMO on the NX-Wafer Automated AFM we will introduce you to the inline metrology capabilities which are needed for full-automatic quality control.
SmartScan MFM Imaging
Friday, May 1, 2020 / 12:00 pm PDT
Magnetic force microscopy (MFM) is a Park Systems advanced AFM mode used for studying surfaces with magnetic properties by detecting the interaction between a magnetized cantilever...
Quick automation set-up for research applications
Wednesday, April 15, 2020/ 9:30 am GMT
In this Live Demo we will walk you through the quick automation set-up for research applications by using SmartScan & StepScan.
SmartScan Topography Imaging
Friday, April 17, 2020/ 12:00 pm PDT
Park Systems Weekly Demo & Chat Sessions is a new series of online, live demonstrations of Park AFM Systems hosted by the Park Systems Technical team. Each week, an engineer from the technical team...
Webinar Recordings
Nanotechnology in Plastics and Packaging
The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Nanotechnology in Plastics and Packaging.
Surface Plasmon Resonance Spectroscopy Tandem with AFM
The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Surface Plasmon Resonance Spectroscopy Tandem with AFM.
Viscoelastic Surfactants and Oilfield Chemicals
The Park Systems 2019 Material Science Research and AFM Webinar Series continues with Viscoelastic Surfactants and Oilfield Chemicals.
Physical Properties of Emergent 2D materials with AFM
In this webinar, the reporter will share some of the experience of using Park AFM (XE 100 and NX10). Since 2011, the reporter has used Park AFM as the main research tool, and made some interesting researches in the study of 2D material properties, the characterization of optoelectronic devices, and the exploration of novel 2D material electronic devices.
2D Nanomaterials for Smart Coatings and Fluids
2-D nanomaterials are known for its property of being only one or two atoms thick. Due to their high ratio of surface area to volume, they immensely benefit from unique physical, chemical, and biological functionality.
Electrochemical Capacitors: Fundamentals, Materials, and Advanced Characterization
This webinar is the first of a two-part webinar series focused on ECs. The first webinar is focused on the fundamental of charge storage in ECs and recent advances in the development of materials for these devices.
Nanostructured Polymer Brushes With AFM
The Park Systems 2019 Material Science Research and AFM Webinar Series kicks off with Nanostructured Polymer Brushes With AFM, focusing on how Atomic Force Microscopy is a vital tool in characterizing the morphology of grafted polymer brushes.
Educational Webinars “AFM Techniques”
Atomic Force Microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping – Cantilever Modulus and Applied Force
The applications staff of Park Systems will give this webinar on atomic force microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping, specifically, we will look at the influence of cantilever stiffness and applied force on the measured modulus.
PinPoint Piezoelectric Force Microscopy
PFM functions by engaging a sample surface with a sharp conductive SPM probe. This probe's tip then has an alternating current (AC) bias applied to it in order to cause a deformation of the sample surface by way of a piezoelectric force.
Electrochemical Atomic Force Microscopy (EC-AFM)
In EC-AFM, users typically perform voltamemetry and corrosion experiments using an electrochemistry cell and a choice of potentiostat or galvanostat depending on the electrochemical application of interest.
PinPoint Nanomechanical Imaging Using Probes of Various Cantilever Stiffness
PinPoint Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion force are acquired simultaneously in real-time.
Scanning Ion Conductance Microscopy (SICM) and Scanning Electrochemical Microscopy (SECM)
SICM uses the increase of access resistance in a nanopipette placed in an electrolyte solution and monitors the ionic current flowing in and out of this probe—a flow that is hindered as the tip closes in on a sample surface.
Educational Videos “How AFM works?”
NanoScientific Talks
AFM experts provide you ONLINE courses, easy and comfortable to join from home! FREE access for you to all content: Webinars, Live Demos, Educational Videos, Software Operation, NanoScientific Talk! Microscopy research has never been so easy before!
Upcoming Webinar
Advanced High Vacuum Magnetic Force Microscopy (MFM): study of topological spin textures
Thursday, July 9, 2020 /11:00 am – 12:30 pm CEST
By now, spintronics is an established field of condensed matter physics and has become an active branch in the sensor and the microelectronics industry.
SmartLitho: Creating nanometer sized structures with ease - July 10, 2020 (Spanish/español)
Friday, July 10, 2020 /12:00 am – 13:00 pm EDT
This webinar will show the ease of use of new SmarLitho software and diverse oxide-based nanolithography experiments.
Pipe Protective Coatings
Friday, July 17, 2020 /12:00 am – 13:00 pm EDT
This is the fifth webinar in our 2020 Material Science Research and AFM Webinar Series, designed to help researchers understand leading edge developments in Materials Science Research and Applications using Atomic Force Microscopy.
Better in Vacuum – how high vacuum improves the accuracy of nanoscale AFM characterization (on NX-Hivac AFM)
Thursday, July 23, 2020 /12:00 am – 13:00 pm EDT
The webinar will give a full introduction to the high vacuum AFM functions and will show the easy-to-use pumping station interface. Moreover, some test measurements will be performed in Frequency Modulation AFM.
SmartLitho Creating nanometer sized structures with ease
Wednesday, June 24, 2020 / 12:00 pm EDT
This webinar will show the ease of use of the new Park SmarLitho software and diverse oxide-based nanolithography experiments.
3D Printing: Testing for Mechanical Properties
Friday, June 19, 2020 / 9:00 am PDT
This is the third webinar in our 2020 Material Science Research and AFM Webinar Series, designed to help researchers understand leading edge developments in Materials Science Research and Applications using Atomic Force Microscopy.
Photovoltaic effect in ferroelectric materials (by using Piezoresponse Force Microscopy PFM)
Wednesday, 17 June 2020 / 11:00 am – 12:30 pm CST
In this talk, thin films of epitaxially grown BiFeO3 and Pb(Zr,Ti)O3 will be used to demonstrate the photoelectrical response from ferroelectric materials.
Advanced Piezoresponse Force Microscopy - optimizing PFM for your applications from off resonance to frequency tracking
Wednesday, 10 June 2020 /11:00 am – 12:30 pm CEST
In this webinar, we provide an overview and introduction of three available PFM modes: Off-resonance single frequency PFM, resonance-enhanced single frequency PFM and dual frequency resonance tracking (DFRT) PFM.
Electrochemical AFM (EC-AFM): Copper Deposition/Dissolution on Gold
Wednesday, May 27, 2020 / 9:00 am – 10:00 am PDT
This webinar explains the basics of EC-AFM and investigation of localized electrochemical deposition and dissolution of copper using the Park NX12 AFM System.
Advances in Scanning Capacitance Microscopy for Electrical Nanocharacterization and Failure Analysis
Wednesday, May 27, 2020 / 11:00 am CEST
In this webinar, we provide an overview and introduction into SCM using a Park Systems NX20 AFM. Furthermore, we will explore the additional options that can be added to traditional SCM using our SmartScan™ Software for improving measurement results and repeatability.
Live Demo
SmartScan Program Mode Imaging
Friday, June 5, 2020 / 12:00 pm PDT
Image size and lateral resolution in Atomic Force Microscope (AFM) images are generally traded off against each other as the AFM records a certain number of pixels per a given scan length, as defined by the operator.
PinPoint™ Nanomechanical Imaging
Friday, June 12, 2020 / 12:00 pm PDT
This session will demonstrate how to acquire nanomechanical properties using Park Systems PinPoint™ Mode.
SmartScan SICM Imaging
Friday, May 29, 2020 / 12:00 pm PDT
This session will demonstrate this technique and focus on Approach Retract Scanning (ARS) to image with a pipette using Park Systems AFM.
SmartScan Lithography
Friday, May 22, 2020 / 12:00 pm PDT
Park AFM’s nanolithography is an advanced AFM technique used to pattern nanoscale shapes onto sample surfaces. In the bias-assisted or anodic oxidation method, a bias voltage is applied to the tip to generate an oxide pattern on a metallic o...
SmartScan SCM Imaging
Friday, May 15, 2020 / 12:00 pm PDT
Scanning Capacitance Microscopy (SCM) is an advanced imaging mode of Park AFM used to map various doping levels of non-uniformly doped semiconductor samples.
Full-automation AFM in-line capabilities with the NX-Wafer
Wednesday, 6 May 2020 / 16:00 pm CEST
In this LIVE DEMO on the NX-Wafer Automated AFM we will introduce you to the inline metrology capabilities which are needed for full-automatic quality control.
Webinar Recordings
Nanotechnology in Plastics and Packaging
The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Nanotechnology in Plastics and Packaging.
Surface Plasmon Resonance Spectroscopy Tandem with AFM
The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Surface Plasmon Resonance Spectroscopy Tandem with AFM.
Viscoelastic Surfactants and Oilfield Chemicals
The Park Systems 2019 Material Science Research and AFM Webinar Series continues with Viscoelastic Surfactants and Oilfield Chemicals.
Physical Properties of Emergent 2D materials with AFM
In this webinar, the reporter will share some of the experience of using Park AFM (XE 100 and NX10). Since 2011, the reporter has used Park AFM as the main research tool, and made some interesting researches in the study of 2D material properties, the characterization of optoelectronic devices, and the exploration of novel 2D material electronic devices.
2D Nanomaterials for Smart Coatings and Fluids
2-D nanomaterials are known for its property of being only one or two atoms thick. Due to their high ratio of surface area to volume, they immensely benefit from unique physical, chemical, and biological functionality.
Electrochemical Capacitors: Fundamentals, Materials, and Advanced Characterization
This webinar is the first of a two-part webinar series focused on ECs. The first webinar is focused on the fundamental of charge storage in ECs and recent advances in the development of materials for these devices.
Nanostructured Polymer Brushes With AFM
The Park Systems 2019 Material Science Research and AFM Webinar Series kicks off with Nanostructured Polymer Brushes With AFM, focusing on how Atomic Force Microscopy is a vital tool in characterizing the morphology of grafted polymer brushes.
Educational Webinars “AFM Techniques”
Atomic Force Microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping – Cantilever Modulus and Applied Force
The applications staff of Park Systems will give this webinar on atomic force microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping, specifically, we will look at the influence of cantilever stiffness and applied force on the measured modulus.
PinPoint Piezoelectric Force Microscopy
PFM functions by engaging a sample surface with a sharp conductive SPM probe. This probe's tip then has an alternating current (AC) bias applied to it in order to cause a deformation of the sample surface by way of a piezoelectric force.
Electrochemical Atomic Force Microscopy (EC-AFM)
In EC-AFM, users typically perform voltamemetry and corrosion experiments using an electrochemistry cell and a choice of potentiostat or galvanostat depending on the electrochemical application of interest.
PinPoint Nanomechanical Imaging Using Probes of Various Cantilever Stiffness
PinPoint Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion force are acquired simultaneously in real-time.
Scanning Ion Conductance Microscopy (SICM) and Scanning Electrochemical Microscopy (SECM)
SICM uses the increase of access resistance in a nanopipette placed in an electrolyte solution and monitors the ionic current flowing in and out of this probe—a flow that is hindered as the tip closes in on a sample surface.
Educational Videos “How AFM works?”
NanoScientific Talks
纳米在线课程 原子力显微镜的专家们提供线上在线课堂教学方式, 足不出户也可以免费听取AFM课程:课程包括网络讲座,Live Demos, AFM相关教育视频,软件运作和纳米科学论坛等视频!
近期网络讲座
PinPointing Polymers: Nanomechanical Characterization of Functional Polymer Blends
3 December, 2020
In this webinar, we will describe and demonstrate polymer characterization using PinPointTM mapping on Park System’s NX10 atomic force microscope. Additionally, we will demonstrate example measurements where electrical property maps are acquired simultaneously with topography and nanomechanical maps.
Nailing down Teflon Molecules : High Resolution AFM imaging for Polymer Science
12 November, 2020
In this webinar, we will demonstrate how atomic force microscopy (AFM) can be used to acquire ultra-high-resolution images of individual PTFE-molecules on the semi-crystalline surface of commercial Teflon tape. Both high resolution and high-speed scanning capabilities of Park Systems NX20 AFM will be demonstrated on the real-world polymer sample.
二维材料界面结构与性质的原子力探针显微学研究(2)- 力学结构与性质
2020年11月5日*星期四 北京时间东八区上午11:00-12:00
本系列报告,将基于我们在原子力显微术的技术研究工作,利用多种先进原子力显微术针对二维材料的本征界面、异质界面以及材料/基底界面开展的研究工作。在每次报告中,我们首先将在较为详细地介绍主要使用的先进AFM模式的基本原理、技术实现及其相关应用。在此基础上,介绍我们利用该AFM模式所开展的关于二维材料界面结构与性质方面的研究工作。希望通过本系列报告有助于相关AFM使用者能够利用比较复杂的AFM功能模式开展研究工作。
Nano: High Resolution AFM imaging for Polymer Science (Joint webinar with Nano Nature)
10am and 5pm, 28 October, 2020
In this webinar hosted by Nano Nature, guest presenter Dr. Vladimir Korolkov (Senior Application Scientist at Park Systems UK) will demonstrate how to better understand the overall structure of polymers. You will learn to resolve individual polymer chains in real space, and witness how atomic force microscopy (AFM) can be used to acquire ultra-high-resolution images of individual PTFE-molecules on the semi-crystalline surface of commercial Teflon tape.
利用静电力显微镜研究ZnO薄膜的耐湿热稳定性
2020年10月22日*星期四 北京时间东八区上午10:00-11:00
本讲座以多晶ZnO基TCO薄膜的耐湿热稳定性为出发点,结合静电力力显微镜(EFM: Electrical Force microscopy)研究ZnO薄膜的晶界稳定性对耐湿热性能的影响,展示了原子力显微镜在氧化物晶界研究中的巨大潜力。
AFM option mode to monitor sample’s properties (with live demo)
October 20, 2020
In this session, a variety of AFM option mode is introduced for investigating sample’s properties such as electrical, mechanical, magnetic, thermal and electrochemical properties. Based on Contact or Non-contact mode, AFM option mode can be combined to monitor sample’s properties as well as topography. Also, we highlight the applications and representative images at each option mode to help your understanding about AFM option mode.
导电原子力显微镜在电子器件纳米级电学测试中的应用
2020年9月24日*星期四 北京时间东八区上午9点到下午6点
导电原子力显微镜(C-AFM)是在扫描探针显微镜(SPM)基础上扩展的一种电学测试模式,它可以同时实现在纳米级对样品(比如:介质材料、量子点、电子器件)表面形貌和局部电学性质的表征和测试。C-AFM 技术在纳米电子学、半导体材料等领域广泛应用,主要用于表征样品/器件的缺陷分布、电导率局部变化、局部电学行为等。本报告将重点围绕C-AFM在忆阻型电子器件中的电学表征,介绍不同环境(大气和真空状态)下测试结果的可靠性,以及通过使用基于C-AFM技术的不同手段来直接观测导电细丝的形成以进一步探索阻变机理。
How to operate AFM (with live demo)
Tuesday, 22 September, 2020 / 13:30 pm SGT
In this session, the basic principles and the application of AFM which can be used in scientific and industrial fields are examined. In particular, we share the images measured by the actual atomic force microscope with specific examples of various applications and look at their meaning. In addition, we present how to operate AFM including cantilever selection, sample preparation, description of imaging parameters and operation in order to obtain better understanding for AFM.
Better in Vacuum – boosting the characterization of 2D semiconductors via electrical AFM in high vacuum
Thursday, 3 September 2020
This webinar explains the basics of EC-AFM and investigation of localized electrochemical deposition and dissolution of copper using the Park NX12 AFM System.
二维材料界面结构与性质的原子力探针显微学研究(1)
2020年8月27日*星期四 北京时间东八区上午11:00-12:00
本系列报告,将基于我们在原子力显微术的技术研究工作,利用多种先进原子力显微术针对二维材料的本征界面、异质界面以及材料/基底界面开展的研究工作。在每次报告中,我们首先将在较为详细地介绍主要使用的先进AFM模式的基本原理、技术实现及其相关应用。在此基础上,介绍我们利用该AFM模式所开展的关于二维材料界面结构与性质方面的研究工作。希望通过本报告有助于相关AFM使用者能够利用比较复杂的AFM功能模式开展研究工作。
网络讲座复播视频
用原子力显微镜研究热电材料中的缺陷物理
原子力显微镜在材料表面形貌和性质的研究中起着重要的作用,不仅可以用于薄膜材料,也可以用于研究单晶表面。热电材料能够利用赛贝克(Seebeck)效应收集废热发电,是一种潜在的绿色能源材料。
原子力显微镜用于体相异质结太阳能电池
原子力显微镜(AFM)是功能强大的扫描探针显微镜(SPM)技术之一,其能将薄膜的局部性质和微区形貌在微米尺度上统一起来,在诸多研究领域得到了广泛的应用。同时,无铅金属卤化物钙钛矿材料,由于其稳定性和对环境无毒性的优点,在LED和太阳能电池方面展现出巨大的研究潜力。
原子力显微镜在钙钛矿太阳能电池中的应用
更多信息请关注公众号:帕克原子力显微镜Park 原子力显微镜(AFM)是功能强大的扫描探针显微镜(SPM)技术之一,其不仅可以探测薄膜的形貌,而且可以表征薄膜的相组成和表面电势。与此同时,钙钛矿太阳能电池近期也引起了人们的广泛兴趣,而钙钛矿薄膜的形态和质量对器件性能有着至关重要的影响。
扫描隧道显微镜(STM)崭新技术和 Park SmartScan
Park原子力显微镜的应用团队很自豪地向您推荐我们的扫描隧道显微镜(STM)模式,这是一种可以在垂直和水平方向实现原子分辨率的表征技术。
教育型网络讲座“AFM技术”
Atomic Force Microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping – Cantilever Modulus and Applied Force
The applications staff of Park Systems will give this webinar on atomic force microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping, specifically, we will look at the influence of cantilever stiffness and applied force on the measured modulus.
PinPoint Piezoelectric Force Microscopy
PFM functions by engaging a sample surface with a sharp conductive SPM probe. This probe's tip then has an alternating current (AC) bias applied to it in order to cause a deformation of the sample surface by way of a piezoelectric force.
Electrochemical Atomic Force Microscopy (EC-AFM)
In EC-AFM, users typically perform voltamemetry and corrosion experiments using an electrochemistry cell and a choice of potentiostat or galvanostat depending on the electrochemical application of interest.
PinPoint Nanomechanical Imaging Using Probes of Various Cantilever Stiffness
PinPoint Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion force are acquired simultaneously in real-time.
Scanning Ion Conductance Microscopy (SICM) and Scanning Electrochemical Microscopy (SECM)
SICM uses the increase of access resistance in a nanopipette placed in an electrolyte solution and monitors the ionic current flowing in and out of this probe—a flow that is hindered as the tip closes in on a sample surface.
教学视频“原子力显微镜的工作原理”
Topic | |
---|---|
原子力显微镜的原理 | 扫描离子电导显微镜 |
接触模式 | 力-距离分光镜 |
非接触模式 | 磁力显微镜 |
轻敲模式 | 力调制显微镜 |
动态接触式静电力显微镜 | 横向力显微镜 |
静电力显微镜 | 纳米压痕 |
导电原子力显微镜 | 纳米光刻 |
电流-电压分光镜 | 热扫描显微镜 |
扫描电容显微镜 | |
扫描开尔文探针显微镜 |