The applications team at Park Systems is proud to present an introduction to Scanning Tunneling Microscopy (STM), a characterization technique that can achieve atomic resolution both vertically and horizontally. STM utilizes a sharp conducting tip and applies a bias voltage between the tip and the sample. When the tip is brought close to the sample, tunneling current occurs and changes exponentially as distance increases, thus providing a remarkably high resolution.
This webinar will explain the basics of STM and review ambient and liquid STM experiments using Park NX series AFM systems. More recent advances in our powerful data analysis software, SmartScan, will be introduced, including PinPoint mechanical mode Nanolithography functions.

Presented By : 
Jiali Zhang, Ph.D., Applications Engineer, Park Systems

Jiali Zhang, Ph.D., is an engineer for Park Systems, where she focuses on the installation and support of AFM systems for Park’s research user base. She is also responsible for researching and writing technical papers and application notes for publication and presentation at scientific conferences. She received her Ph.D. in Analytical Chemistry from the University of California, Davis, and holds a B.S. in Applied Chemistry from Donghua University in Shanghai, China. Her expertise spans numerous microscopy techniques, and areas of study have also included biological systems and 3D printing technologies.