Electrical and Mechanical Characterization of Li Ion Battery Electrode using Pinpoint SSRM
John Paul Pineda, Cathy Lee, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA Introduction Lithium ion batteries (LIBs) are key components of modern electronics and ar...
Advantages of High Vacuum for Electrical Scanning Probe Microscopy
Jonathan Ludwig1,2, Marco Mascaro1,2, Umberto Celano1, Wilfried Vandervorst1,2, Kristof Paredis1 1. IMEC, Leuven, Belgium 2. Department of Physics and Astronomy, University of Leuven, Leuven, Belgiu...
Defect Recognition on Coating Layer using PinPoint Nanomechanical Mode, Atomic Force Microscopy
Moses Lee, Jake Kim and Cathy Lee Park Systems Corporation, Suwon, Korea Introduction Surface treatment is a critical component in a variety of fields and industries such as automobil...
Mechanical properties of live and fixed cells measured by atomic force microscopy and scanning ion conductance microscop...
Jake Kim, Moses Lee and Cathy Lee Park Systems Corp., Suwon, Korea Abstract During the process of cell sample preservation, cell fixation plays an essential role for a wide range of ...
Enhanced Surface Potential Detection Study using FM - KPFM
John Paul Pineda, Charles Kim,Cathy Lee, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA Introduction Scanning Kelvin probe microscopy (KPFM) is a tool used to measure work functio...
利用导电探针原子力显微镜(C-AFM)测量碳纳米管薄膜导电性
John Paul Pineda, Gerald Pascual, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA 摘要 导电性测量是一种有效的方法, 可用来描述某些特殊应用中材料的特...
电化学原子力显微镜(EC-AFM)实时监测铜在金表面的电沉积
介绍 近年来,对电化学过程的理解如电沉积(也称电镀)在各种科学技术中的作用变得非常凸显,包括括微电子、纳米生物系统、太阳能电池、...
利用AFM PINPOINT 纳米机械模式定量材料的弹性模量 比力体积谱快两个数量级
介绍 自原子力显微镜发明以来,原子力显微镜通过在纳米尺度上提供精准、可靠、无损的成像,在材料科学和元件工程中产生了重要的影响。原子力显...
Tooth Whitening Study using PinPoint Nanomechanical Mode of Park AFM
Alvin Lee, John Paul Pineda, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA Introduction In recent years, the importance of mechanical properties measurement has become evident in...
Transforming Technology and Manufacturing in the age of 3-D Printing
“PARK ATOMIC FORCE MICROSCOPY (AFM) PLAYS AN IMPORTANT ROLE IN OUR 3-D PRINTING PROJECTS IN THE LABORATORY. THIS POWERFUL TOOL IS CAPABLE OF LOOKING AT THE SURFACE PROFILE OF 3-D PRINTED OBJECTS CRE...
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