PinPoint Piezoelectric Force Microscopy
Wenqing Shi, Cathy Lee, Gerald Pascual, John Paul Pineda, Byong Kim, Keibock Lee Park Systems Inc., Santa Clara, CA USA ABSTRACT Electromechanical couplingin materials is a key property that provide...
Using AFM PinPoint™ Nanomechanical Mode for Quantification of Elastic Modulus in Materials Two Orders of Magnitude Fas...
John Paul Pineda, Gerald Pascual, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA Introduction Since the invention of atomic force microscopy, AFM has had a revolutionary impact in...
Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electroche...
Conductive AFM (C-AFM) is uniquely suited to perform electrical measurements such as current distribution with nanoscale precision and can be performed in contact mode, tapping mode, or PinPoint™ mo...
Electrochemical Atomic Force Microscopy: In Situ Monitoring of Copper Electrodeposition on Gold Surface
Optimum Current Distribution Measurement of Zinc Oxide Nanorods via PinPoint™ Conductive AFM
Differentiating Material Compositions using Lateral Force Microscopy
Wenqing Shi, Gerald Pascual, Byong Kim, and Keibock Lee Park Systems, 3040 Olcott Street, Santa Clara, CA 95054 ABSTRACT Nanoscale frictional measurement, or nanotribology, is an effective approach ...
Park NX-Hivac: Phase-lock Loop for Frequency Modulation Non-Contact AFM
Hosung Seo, Dan Goo and Gordon Jung, Park Systems Corporation Romain Stomp and James Wei Zurich Instruments Phase-locked looping is a powerful technique that allows synchronization of multipl...
Automated Non-Destructive Imaging and Characterization of Graphene/hBN Moiré Pattern with Non-Contact Mode AFM
Graphene has attracted researchers' attention due to its unique band gap structure, which allows it to be used in high-mobility semiconductor devices. However, realization of such a graphene-based hig...
In Electrolyte Solution Topography Imaging of Various Organic Samples using Park NX10 Scanning Ion Conductance Microscop...
In order to identify and understand the root cause of a problem then develop an appropriate countermeasure, it is sometimes necessary to characterize a sample in situ. Several cutting edge application...
Park SmartScan's Point-And-Click Imaging Technology Revolutionizes Atomic Force Microscopy
An AFM is an extremely versatile tool for engineers, researchers, and other professionals that need accurate imaging and characterization of specimens at the nanoscale. It allows users to measur...
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