Fast Imaging from Park Systems is a highly useful mode for applications requiring high-speed AFM measurements such as sample screening or research in fields like biomolecular dynamics where the observation of the sample’s movements through rapid measurements is critical. All Park NX Series AFMs are built for Z scanner feedback speed and optimized Z servo control so that an ultra high frequency cantilever is all that is needed to carry out high-speed AFM imaging. Fast Imaging enables the operator to perform quick and highly accurate imaging of sample surfaces with a variation in feature heights ranging from single nanometers to tens of nanometers.