As critical dimensions shrink and device complexity increases, the quality of your data is critical for the success of your research, analysis, and ultimately device yield. The key to quality results is accuracy at the nanoscale. Park NX20, the world's most accurate AFM for FA and QA, is the only high-end, large-sample AFM with non-contact mode for preserving tip sharpness. Park NX20 provides the highest accuracy and repeatability for roughness measurements and defect review. Park NX20 offers the highest productivity and the industry's lowest AFM lifecycle costs by dramatically lowering tip costs by extending tip lifetime. The result is a total AFM solution for FA and QA that meets accuracy, productivity and budgetary needs.
- 产品及服务
- 表面分析和研究的原子力显微镜
- 小样品原子力显微镜
- 大样品原子力显微镜
- 高真空环境原子力显微镜
- 原子力显微镜探针和选项
- 用于产线计量的原子力显微镜
- 晶圆厂AFM
- 用于平板显示器的原子力显微镜
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- 表面分析和研究的原子力显微镜
- 用于产线计量的原子力显微镜
- 用于薄膜表征的椭偏技术
- 主动隔振
- 操作软件
- 应用
- 技术支持
- 动态
- 公司概况
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