Investigation of Contact Resistances in n-Type Organic Transistors through Scanning Kelvin Probe Force Microscopy
Speaker : Federico Chianese Affiliation : University of Naples Region : Europe Year : 2019 Language : English Explore the investigation of contact resistances in n-type organic transistors using Scanning Kelvin Probe Force Microscopy (SKPFM). Understand the challenges in organic electronics, including air stability, low field-effect mobilities, and contact resistances. Discover how SKPFM provides direct estimation of contact resistances, revealing insights into device performance and morphology.
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