Wednesday, March 25th
Speaker: Dr. James Kerfoot, Application Scientist, Park Systems United Kingdom
Explore how AFM enables nanoscale measurement and manipulation of ferroelectric materials. See how the FX series AFMs automatically switch probes and modes to perform HD-KPFM and DFRT-PFM measurements. Join the webinar to discover advanced capabilities for ferroelectric characterization.
Thursday, April 23rd
Speaker: Dr. James Kerfoot, Application Scientist, Park Systems United Kingdom
Explore how AFM enables precise manipulation and characterization of layered materials. This webinar features live demonstrations of graphene cutting and moiré pattern measurements using our FX series AFMs. Learn how automated probe and mode switching simplifies advanced layered materials research.
Thursday, April 30th
Speaker: Dr. Jake Kim, Lead of Technical Support Team, Park Systems Corporation
Non-uniform thin-film coatings on curved surfaces are difficult to evaluate using conventional metrology techniques. Discover how Imaging Spectroscopic Ellipsometry enables precise thickness mapping and provides deeper insight into coating uniformity across complex structures. Join this session to explore how advanced metrology approaches can strengthen failure analysis and improve process control strategies.
Tuesday, May 19th
Speaker: Dr. James Kerfoot, Application Scientist, Park Systems United Kingdom
Discover how automated AFM accelerates nanoscale research on layered materials. This webinar demonstrates how the FX200 AFM automatically switches probes and modes to capture high-resolution data across multiple samples. Learn how techniques such as NCM, LFM, and C-AFM reveal moiré patterns and enable faster materials discovery.
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Tuesday, May 26th
Speaker: John Park, RE Application Technology Team, Park Systems Corporation
Gain a foundational understanding of IR-AFM, from core operating principles to key measurement modes. This session provides practical insights to help researchers confidently interpret data and apply IR-AFM in real-world workflows. Join this upcoming session to deepen your expertise in nanoscale chemical analysis and expand your practical understanding of IR-AFM.
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Monday, June 8th
Speaker: Luna Kim, RE Application Technology Team, Park Systems Corporation
Explore the fundamentals of IR-AFM and how different measurement modes impact data quality and interpretation. This webinar delivers a clear, practical framework for applying IR-AFM in advanced materials research and analytical workflows. Join this expert-led session to expand your nanoscale chemical analysis capabilities and gain actionable insights you can apply in your research.