Name: Products
Brand: Park Systems
Availability: InStoreOnly

Products & Solutions

Park Systems delivers advanced nanoscale metrology solutions across research and industrial applications. Research AFMs feature a decoupled scanner architecture and True Non-Contact™ technology for distortion-free, high-resolution imaging, with AI-powered SmartScan for intuitive operation. Industrial AFMs offer fully automated, high-throughput 3D metrology for semiconductor manufacturing, display technology, and quality assurance. Beyond AFMs, Imaging Spectroscopic Ellipsometry (ISE), White Light Interferometry (WLI), AFM-IR spectrometers, and Digital Holographic Microscopy (DHM) extend Park Systems' capabilities across optical, infrared, and phase-imaging modalities. Active Vibration Isolation (AVI) systems ensure measurement stability across all platforms.

Atomic Force Microscopes

Research AFM

Versatile high-resolution AFMs for nanoscale research and analysis

Atomic Force Microscopes

Industrial AFM

Fully Automated in-line AFMs for semiconductor and industrial applications

Ellipsometer

High-resolution optical metrology for thin film microanalysis

Digital Holographic Microscopes

Non-contact 3D optical microscopy for research and industrial applications

Active Vibration Control

Active Vibration Isolation

Vibration Isolation systems for enhanced measurement data quality

AFM Accessories

Accessories

Nano Standard Samples for calibration, AFM probes for simplified setup