Photonics

Imaging Ellipsometry

Imaging ellipsometry enables spectroscopic ellipsometric analysis of small
optical fibers and waveguides with lateral resolution down to 1 µm. It provides
highly precise refractive index measurements on waveguides, vertical facets, and fiber ends, detecting relative differences smaller than 0.001. The system offers exceptional film thickness measurement capability with a resolution of 0.1 nm and operates across a broad spectral range from 190 to 1700 nm, with an optional IR upgrade extending up to 2700 nm. A single measurement yields multiple results, including film thickness, refractive index, composition, and contamination
analysis. For fast and effective quality control, ECM (Ellipsometric Contrast-enhanced Microscopy) mode enhances contrast and visualization.
These features make imaging ellipsometry particularly valuable for applications in photonics, integrated photonic circuits, vertical facets, and optical fiber analysis.