Park FX40 IR
The non-contact AFM for small-sample chemical imaging
Key Features
Park FX40 IR is Park Systems’ advanced AFM solution for nanoscale infrared spectroscopy and imaging, combining chemical and surface characterization on the proven FX40 platform. With low noise, minimal thermal drift, and enhanced mechanical stability, it delivers precise and reliable measurements.
Built on Photo-induced Force Microscopy (PiFM), the FX40 IR integrates an orthogonal scan system, True Non-contact™ mode, and automation features including automatic probe exchange, IR beam alignment, and multi-point measurement to ensure consistent, non-invasive operation and streamlined workflows for precise nanoscale chemical characterization.
Built on Photo-induced Force Microscopy (PiFM), the FX40 IR integrates an orthogonal scan system, True Non-contact™ mode, and automation features including automatic probe exchange, IR beam alignment, and multi-point measurement to ensure consistent, non-invasive operation and streamlined workflows for precise nanoscale chemical characterization.
Reliable Nano-IR Analysis
Park Advanced AFM Technology
Photo-induced Force Microscopy
Photo-induced Force Microscopy (PiFM) detects photo-induced forces generated by resonant molecular vibrations excited with a tunable IR laser. In Park FX200 IR, the AFM cantilever operates in Non-contact™ mode to measure local IR absorption without touching the sample, enabling spectral and chemical mapping with sub-5 nm spatial resolution and monolayer sensitivity.
Applications
Flexible Upgrade Path
Future-Ready, On Your Timeline
Start with the FX40 (IR-upgradeable system) first, then expand to nano-IR capabilities later without changing platforms. A flexible upgrade path designed to adapt to evolving research priorities and investment plans.
