News
10
Dec 2012'
Press-Release
Santa Clara, California, December 10, 2012
Park XE-Bio, the leading atomic force microscopy (AFM) system for cell biology imaging, was featured in the Journal of E...
3
Dec 2012'
Press-Release
Closed-loop XY scan with dual servo achieves the unprecedented accuracy and orthogonality in AFM scans
Santa Clara, California, USA, December 3, 2012
Park S...
1, Dec 12'
Newsletters
Welcome to Park Q4, 2012 Newsletter
Featured Application Featured Product News and Events Upcoming Exhibitions Park Research ...
26, Nov 12'
Press-Release
Park Systems introduces the NX20, a high-end, large sample atomic force microscope (AFM) for failure analysis (FA) and quality assurance (QA) laboratories that will benef...
26
Oct 2012'
Press-Release
Industry leading low-noise Z detector is used for the default AFM topography signal.
Santa Clara, California, October 26, 2012
Park Systems announces True Sample...
1
Oct 2012'
Press-Release
Santa Clara, California, October 1, 2012
Park Systems, the atomic force microscopy leader, and Emphor free zone company (Dubai, UAE), a leading technology integrator and...
16
Aug 2012'
Press-Release
Park Systems today announced that the Korean Ministry of Knowledge and Economy awarded the Park NX10, the world’s most accurate atomic force microscope, as a NanoKorea 20...
20
Apr 2012'
Press-Release
Santa Clara, California, April 20, 2012
Park Systems, Inc. today announced that Keibock Lee has joined the company as its president and general manager of Park America.&...