High resolution topography image of polymer fiber network collected using True Non-Contact™ mode. The image shows the interwoven network of polymer fibers  Park Ana...

Keibock Lee, Park Systems President The live demos are a great way for us to offer education on Park Atomic Force Microscopy Imaging to further enhance the user experien...

Dr. Rigoberto Advincula, Professor at Case Western Reserve University, Director of the PETRO Case Consortium at CWRU. The demanding applications of materials for th...

Park Systems XE7-CR "Park AFM meets our rigid requirements for accurate measurements at the highest nanoscale resolution at a price we can afford."Dr. Gwo-Ching Wang, Pr...

Park NX Wafer Atomic Force Mircroscope "Park NX Wafer, bare wafer ADR is the most advanced, fully automated defect review solution available -designed for leaders in Se...

   The cover image shows the world’s first observation of rat tracheal tissue in an aqueous environment. The luminal surface of the trachea tissue was successf...

Park NX-PTR AFM Nanometrology Pole Tip Recession (PTR) measurements for inline HDD slider "Park Systems trademark AFM line demonstrates the accuracy and reliabilit...