News
13, Jul 17'
Park in the News
Using scanning capacitance microscopy with a Park Systems atomic force microscope a team at NASA successfully characterized both the spatial variations in capacitance as ...
11, Jul 17'
Press-Release
Park NX Wafer Low Noise, High Throughput Automatic Force Profiler with Automatic Defect Review
Park continues to produce cost saving value proposition innovations ...
19, Apr 17'
Press-Release
SANTA CLARA, Calif., April 18, 2017
Park Systems, world-leader in atomic force microscopy (AFM) recently announced the opening of their European Headquarters in Heidelbe...
14
Feb 2017'
Park in the News
SANTA CLARA, CA (Marketwired - February 13, 2017)
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997, just announced that Park SmartScan a...
15
Nov 2016'
Press-Release
SANTA CLARA, CA NOVEMBER 10, 2016
Park Systems announces the 2017 Park AFM Scholarship Award eligible to undergraduate or postdoctoral students working in nanotechnology...
10
Oct 2016'
Press-Release
SANTA CLARA, CA October 07, 2016
Park Systems congratulates Jean-Pierre Sauvage, James Fraser Stoddart and Bernard Feringa on being awarded the 2016 Nobel Pr...
9, Oct 16'
Press-Release
The winners of the 2016 Kavli Prize in Nanoscience and the CEO of Park Systems pose at the award ceremony in Oslo Concert Hall Monday 6 September.
The 2016 Kavli Prize i...
5, Aug 16'
Press-Release
Park NX20 300mm - first research AFM on the market capable of scanning the entire sample area of 300 mm wafers using a 300 mm vacuum chuck while keeping the system noise ...
4, Aug 16'
Park in the News
Atomic Force Microscopy (AFM) leader Park Systems has simplified 300mm silicon wafer defect review by automating the process of obtaining high-resolution 3D images, makin...
18, Jul 16'
Park in the News
News from Frost & SullivanJuly 18, 2016 at 8:00 AM
MOUNTAIN VIEW, Calif. — July 18, 2016 —Frost & Sullivan announced today that Park Systems, the leading...