Park Nanostandard Store
AFM Tip Characterizer (AFMTC)
Option Description
AFMTC sample consists of 10 Multiple Narrow Trenches (10 ~ 50 nm) and a 50 nm Isolated Line. This sample is designed to evaluate the shape characterization of AFM tips.
Manufactured by Kims Reference Corp. (internationally accredited reference materials producer from ILAC-MRA and KOLAS via ISO-17034)
Specifications
- Trench widths : 10 / 13 / 16 / 19 / 22 / 26 / 30 / 35 /40 / 50 nm
- Line widths : 50 nm
- Step height : 100 nm (not certified)
- Pattern length : 4.0 mm (certified region: 3 mm from center)
- Material : Polycrystalline silicon
- Traceability: Si lattice constant measured by TEM
Explore Other Samples
.jpg)
.jpg)
.jpg)
.jpg)
.jpg)
.jpg)
.jpg)