介绍 在过去的几十年中，原子力显微镜（AFM）已经深入参与了纳米尺度的研究和开发。虽然已被广泛使用，但对AFM数据的理解有时还是很麻烦，特别是...

SSRM AFM，用于半导体失效分析的最佳选择 Park NX-Hivac上提供的高真空扫描扩展电阻显微镜（SSRM），可实现新一代设备的2D载体轮廓分析，并在高真空条件...

Gabriela Mendoza, Ph.D., Park Systems Mexico. Introduction The unique structures of liposomes – lipid vesicles (spherical structures with a bilayer membrane) of varying size and structural complex...

Research Application Technology Center, Park Systems Corp. 介绍 自原子力显微镜（AFM）[1]发明以来，它被广泛应用到了样品表面无损成像中，其电学、磁学和力学等...

Sang-Joon Cho, Vice President and director of R&D Center, Park Systems Corp. Ilka M. Hermes, Principal Scientist, Park Systems Europe.   利用原子力显微�...

J. Serron, A.Minj, L. Wouters, T. Hantschel IMEC, Leuven, Belgium 介绍:   随着传统场效应晶体管 (FET) 的逐渐规模化，如何克服短沟道效应的不利影响变得越�...

通过边带KPFM对分子聚集体进行电势成像 Ilka M. Hermes, Andrea Cerreta Park Systems Europe GmbH, Mannheim, Germany 功函数是一种材料特性，可用于区分复合材料中的�...

  Ilka M. Hermes,1 Simonas Krotkus,2 Ben Conran,3 Clifford McAleese,3 Xiaochen Wang,3 Oliver Whear,3 Michael Heuken2 1 Park Systems Europe GmbH, Mannheim, Germany 2 AIXTRON SE, Herzogenrath,...

  Research Application Technology Center, Park Systems Corporation Introduction Since the development of Atomic Force Microscopy (AFM) [1], several measurement modes have been developed to cha...

  John Paul Pineda, Charles Kim, and Byong Kim Park Systems, Inc., Santa Clara, CA USA Introduction Sophisticated, high-performing technology often requires electrical components with advance...