通过边带KPFM对分子聚集体进行电势成像 Ilka M. Hermes, Andrea Cerreta Park Systems Europe GmbH, Mannheim, Germany 功函数是一种材料特性，可用于区分复合材料中的�...

  Making the connection. Atomic force microscopy correlates Graphene’s functional properties on the nanoscale Ilka M. Hermes,1 Simonas Krotkus,2 Ben Conran,3 Clifford McAleese,3 Xiaoche...

  Research Application Technology Center, Park Systems Corporation Introduction Since the development of Atomic Force Microscopy (AFM) [1], several measurement modes have been developed to cha...

  John Paul Pineda, Charles Kim, and Byong Kim Park Systems, Inc., Santa Clara, CA USA Introduction Sophisticated, high-performing technology often requires electrical components with advance...

  Armando Melgarejo, Ben Schoenek, Jiali Zhang, and Byong Kim Park Systems, Inc., Santa Clara, CA, USA Introduction The field of nanotechnology has diversified into different areas of researc...

Lennaert Wouters1, Albert Minj1,2, Umberto Celano1, Thomas Hantschel1, Wilfried Vandervorst1,2, Kristof Paredis1 1IMEC, Leuven, Belgium 2Department of Physics and Astronomy, University of Leuven, Le...

Ilka Hermes1, Romain Stomp2 1Park Systems Europe, Mannheim, Germany 2Zurich Instruments, Zurich, Switzerland 介绍 铁电材料由于其独特的机电特性和电学特性，在工业上得到�...

High Resolution Phase Imaging of Polymer Thin Film Coated on Gold (Au) John Paul Pineda, Charles Kim, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA INTROD...

Nanoscale Material Patterning using Atomic Force MicroscopyNano-Lithography John Paul Pineda, Charles Kim, Cathy Lee, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA INTROD...

Perovskites responding to light (Credit Greg Stewart/SLAC National Accelerator Laboratory) Ryan P. Dwyer1,2, John A. Marohn1   Summary KPFM experiments are used to image capacitance and surfa...